• DocumentCode
    2223919
  • Title

    Pattern association from noisy images by the network constraint analysis

  • Author

    Ishikawa, Seiji ; Ogami, Yoshihiro ; Kato, Kiyoshi

  • Author_Institution
    Dept. of Electr., Electron. & Comput. Eng., Kyushu Inst. of Technol., Kitakyushu, Japan
  • fYear
    1993
  • fDate
    15-19 Nov 1993
  • Firstpage
    1382
  • Abstract
    This paper describes a technique for realizing visual association by the network constraint analysis. In order to make machine visual processing more practical and powerful, it is important to develop a technique for understanding various noise superimposed images. To solve this problem, a two-stage association technique is proposed based on network constraint analysis. In the first stage, strict screening of the memory which contains reference images is performed employing an acquired noisy image to yield an intermediate image, while in the second stage, rather weaker screening of the memory is done by the intermediate image and depth first search is applied to those surviving image pieces in the memory to finally obtain an associated image. An algorithm to speed up the association process is also employed in the second stage. Performance of the two-stage association is examined by an experiment employing real noisy alphabetical images and satisfactory results are obtained
  • Keywords
    computer vision; constraint theory; image sensors; search problems; depth first search; machine visual processing; network constraint analysis; noise superimposed images; noisy alphabetical images; noisy images; pattern association; reference images; two-stage association technique; visual association; Computer networks; Humans; Image analysis; Image recognition; Interference constraints; Pattern analysis; Pixel; Power engineering and energy; Power engineering computing; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-0891-3
  • Type

    conf

  • DOI
    10.1109/IECON.1993.339270
  • Filename
    339270