DocumentCode
2224075
Title
Order parameters for minimax entropy distributions: when does high level knowledge help?
Author
Yuille, A.L. ; Coughlan, James ; Zhu, Song Chun ; Wu, Yingnian
Author_Institution
Smith-Kettlewell Eye Res. Inst., San Francisco, CA, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
558
Abstract
Many problems in vision can be formulated as Bayesian inference. It is important to determine the accuracy of these inferences and how they depend on the problem domain. In recent work, Coughlan and Yuille showed that, for a restricted class of problems, the performance of Bayesian inference could be summarized by an order parameter K which depends on the probability distributions which characterize the problem domain. In this paper we generalize the theory of order parameters so that it applies to domains for which the probability models can be obtained by Minimax Entropy learning theory. By analyzing order parameters it is possible to determine whether a target can be detected using a general purpose “generic” model or whether a more specific “high-level” model is needed. At critical values of the order parameters the problem becomes unsolvable without the addition of extra prior knowledge
Keywords
computer vision; inference mechanisms; Bayesian inference; Minimax Entropy learning theory; high level knowledge; minimax entropy distributions; order parameters; Bayesian methods; Computer vision; Electrical capacitance tomography; Entropy; Information science; Minimax techniques; Probability distribution; Roads; Statistics; Target tracking;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
Conference_Location
Hilton Head Island, SC
ISSN
1063-6919
Print_ISBN
0-7695-0662-3
Type
conf
DOI
10.1109/CVPR.2000.855869
Filename
855869
Link To Document