• DocumentCode
    2224075
  • Title

    Order parameters for minimax entropy distributions: when does high level knowledge help?

  • Author

    Yuille, A.L. ; Coughlan, James ; Zhu, Song Chun ; Wu, Yingnian

  • Author_Institution
    Smith-Kettlewell Eye Res. Inst., San Francisco, CA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    558
  • Abstract
    Many problems in vision can be formulated as Bayesian inference. It is important to determine the accuracy of these inferences and how they depend on the problem domain. In recent work, Coughlan and Yuille showed that, for a restricted class of problems, the performance of Bayesian inference could be summarized by an order parameter K which depends on the probability distributions which characterize the problem domain. In this paper we generalize the theory of order parameters so that it applies to domains for which the probability models can be obtained by Minimax Entropy learning theory. By analyzing order parameters it is possible to determine whether a target can be detected using a general purpose “generic” model or whether a more specific “high-level” model is needed. At critical values of the order parameters the problem becomes unsolvable without the addition of extra prior knowledge
  • Keywords
    computer vision; inference mechanisms; Bayesian inference; Minimax Entropy learning theory; high level knowledge; minimax entropy distributions; order parameters; Bayesian methods; Computer vision; Electrical capacitance tomography; Entropy; Information science; Minimax techniques; Probability distribution; Roads; Statistics; Target tracking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
  • Conference_Location
    Hilton Head Island, SC
  • ISSN
    1063-6919
  • Print_ISBN
    0-7695-0662-3
  • Type

    conf

  • DOI
    10.1109/CVPR.2000.855869
  • Filename
    855869