DocumentCode :
2224221
Title :
1993 International Symposium on Electromagnetic Compatibility
fYear :
1993
fDate :
9-13 Aug. 1993
Abstract :
The following topics are dealt with: regulatory considerations; electrostatic discharge; EMC (electromagnetic compatibility) analysis; RF environment, EMC emissions; EMC instrumentation; ELF environment; shielding materials; shielding apertures; measurement; nonsinusoidal fields and waves; 3-D numerical modeling; printed circuit boards; transients; EMC test facilities; computer modeling; and lightning and EMP (electromagnetic pulse)
Keywords :
computer aided analysis; electric variables measurement; electromagnetic compatibility; electromagnetic shielding; electrostatic discharge; instrumentation; legislation; lightning; magnetic variables measurement; modelling; numerical analysis; printed circuits; radiofrequency interference; test facilities; transients; 3-D numerical modeling; ELF environment; EMC analysis; EMC emissions; EMC instrumentation; EMC test facilities; EMP; PCB; RF environment; computer modeling; electromagnetic compatibility; electromagnetic pulse; electrostatic discharge; lightning; measurement; nonsinusoidal fields; nonsinusoidal waves; printed circuit boards; regulatory considerations; shielding apertures; shielding materials; transients;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-1304-6
Type :
conf
DOI :
10.1109/ISEMC.1993.473794
Filename :
473794
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2224221
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