• DocumentCode
    2224302
  • Title

    Improvement of wavelet threshold and application on thin-film thickness wideband monitoring system

  • Author

    Xiao-yan, Shang ; Jun, Han

  • Author_Institution
    Sch. of Optoelectron. Eng., Xi´´an Technol. Univ., Xi´´an, China
  • Volume
    6
  • fYear
    2010
  • fDate
    20-22 Aug. 2010
  • Abstract
    During the course of noise reduction, wavelet threshold filtering algorithm can inhibite noise effectively, however Donoho threshold function hasn´t self-adaption between dimensions and results in signal details´ losing. Based on output signal of the thin-film thickness wideband monitoring system, it is processed by the improved Donoho threshold function whose threshold is added by micro-alignment factor, this factor makes wavelet coefficient threshold of the signal decrease, whose amplitude is similar to or less than niose one, this is beneficial to preserve wavelet coefficients of real signals; On the other hand, this factor makes that of noise increase, this is favorable to filter out noise. By experiment, it represents that both rejecting true probability and false declaration probability are reduced, the random noise is filtered well and the signal details are reserved perfectly in use of this algorithm, the peak error of signal is 0.7%~1.0%,the peak location one is 0.1%~0.3%,the system accuracy is improved.
  • Keywords
    computerised monitoring; digital filters; interference suppression; probability; wavelet transforms; Donoho threshold function; microalignment factor; noise filtering; noise reduction; probability; thin-film thickness wideband monitoring system; wavelet coefficient threshold; wavelet threshold filtering algorithm; Filtering algorithms; Noise; Wavelet transforms; Wideband; Donoho threshold function; micro-alignment factor; self-adaption; wavelet threshold filtering algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Computer Theory and Engineering (ICACTE), 2010 3rd International Conference on
  • Conference_Location
    Chengdu
  • ISSN
    2154-7491
  • Print_ISBN
    978-1-4244-6539-2
  • Type

    conf

  • DOI
    10.1109/ICACTE.2010.5579378
  • Filename
    5579378