• DocumentCode
    2224393
  • Title

    Investigations of carbide electrodes in high-current pseudospark switches

  • Author

    Schwandner, A. ; Görtler, A. ; Christiansen, J. ; Frank, K. ; Hoffmann, D.H.H. ; Prucker, U.

  • Author_Institution
    Phys. Dept., Erlangen-Nurnberg Univ., Germany
  • Volume
    2
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    1014
  • Abstract
    Semiconducting carbides, SiC and BC, were tested as electrode material in pseudospark switches. Typical parameters of the test circuit were a charging voltage of 20 kV, a peak current up to 120 kA and a pulse length of 5 μs (weakly damped sinusoidal pulse shape). In comparison to metal electrodes no differences in the electrical signals were detected. Optical investigations with a fast shutter assumed that the discharge starts on the axis. At later times the discharge plasma is homogeneously distributed over the total carbide surfaces of the electrodes. No cathode spots were observed. The erosion rate is low in comparison to molybdenum electrodes. The lifetime of the switch is enlarged as first tests show, but the holdoff voltage is limited due to field enhancement at the triple point metal, carbide, and gas
  • Keywords
    boron compounds; cathodes; pulsed power switches; semiconductor materials; silicon compounds; sparks; 120 kA; 20 kV; 5 mus; BC; SiC; carbide electrodes; cathode spots; charging voltage; discharge plasma; erosion rate; fast shutter; field enhancement; high-current pseudospark switches; holdoff voltage; peak current; test circuit; weakly damped sinusoidal pulse shape; Circuit testing; Electrodes; Materials testing; Optical pulse shaping; Optical switches; Pulse circuits; Semiconductivity; Semiconductor device testing; Silicon carbide; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545519
  • Filename
    545519