Title :
Library building technique for high-reliability submicron ASIC
Author :
Longwang, Wang ; Jiancheng, Li
Author_Institution :
Beijing Microelectron. Technol. Inst., China
Abstract :
This paper describes the technique of submicron ASIC design on reliability and the methodology of ASIC library building. Additionally, this paper has represented the results of the research
Keywords :
application specific integrated circuits; circuit CAD; integrated circuit design; integrated circuit reliability; software libraries; library building technique; reliability; submicron ASIC design; Application specific integrated circuits; Buildings; Current density; Hot carrier effects; Inductance; Libraries; Semiconductor device modeling; Semiconductor process modeling; Voltage; Wire;
Conference_Titel :
ASIC, 2001. Proceedings. 4th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6677-8
DOI :
10.1109/ICASIC.2001.982522
