Title :
The reasons of deterioration of LTE signal. Comparison of bit error rate for different types of modulation
Author :
Melnychuk, I.E. ; Avdeieva, D.A. ; Shelkovnikov, B.N.
Author_Institution :
Inst. of Telecommun. Syst., NTUU KPI, Kiev, Ukraine
Abstract :
The present paper concerns the reasons of deterioration of LTE signal, key parameters of which should be considered at testing of user´s terminals. The diagram of the transceiver of LTE technology for downlink frequency division duplex of channel with fading is considered. The diagram presents relation of bit error rate to noise ratio for different types of modulation.
Keywords :
Long Term Evolution; error statistics; fading channels; modulation; radio receivers; LTE signal; LTE technology; bit error rate; fading channel; frequency division duplex; modulation; transceiver; Bit error rate; Downlink; Electronic mail; Long Term Evolution; Noise; Phase shift keying;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
