• DocumentCode
    2224684
  • Title

    Effects of delay models on maximum power estimation of VLSI circuits

  • Author

    Junming, Lu ; Zhenghui, Lin

  • Author_Institution
    LSI Res. Inst., Shanghai Jiaotong Univ., China
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    179
  • Lastpage
    182
  • Abstract
    Previous work has shown that maximum switching density at a given node is extremely sensitive to a slight change in the delay at that node. In this paper, five delay models have been discussed in terms of maximum power estimation of VLSI sequential circuits. The effects of these delay models are analyzed. Results for the five delay models are reported for ISCAS89 sequential benchmark circuits
  • Keywords
    VLSI; circuit simulation; covariance analysis; delays; genetic algorithms; integrated circuit modelling; logic simulation; parameter estimation; sequential circuits; ISCAS89 sequential benchmark circuits; VLSI circuits; VLSI sequential circuits; circuit node; delay models; genetic algorithm; maximum power estimation; maximum switching density; node delay; statistic delay model; Delay effects; Delay estimation; Genetic algorithms; Libraries; Power dissipation; Power measurement; Sequential circuits; Statistics; Switching circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2001. Proceedings. 4th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-6677-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2001.982526
  • Filename
    982526