Title :
An overview of library characterization in semi-custom design
Author :
Ackalloor, Binay ; Gaitonde, Dinesh
Author_Institution :
Semicond. Products Sector, Motorola Inc., Phoenix, AZ, USA
Abstract :
In the last ten years, library characterization has made tremendous advancements, from script based systems running on circuit simulators to sophisticated automated systems. The advent of deep sub-micron design and the rapid progression of process technology pose new challenges, from rapid library retargeting to accounting for interconnect and high frequency effects. This paper begins with an assessment of current characterization flows. This is followed by discussions on data management, the effects of resistive interconnect and high frequency design, and rapid retargeting of existing libraries to new processes
Keywords :
VLSI; application specific integrated circuits; circuit CAD; integrated circuit design; integrated circuit interconnections; software libraries; characterization flows; data management; deep sub-micron design; high frequency design; high frequency effects; library characterization; library retargeting; resistive interconnect; semi-custom design; Automation; Circuit simulation; Delay; Frequency; Integrated circuit interconnections; Libraries; Temperature; Threshold voltage; Timing; Working environment noise;
Conference_Titel :
Custom Integrated Circuits Conference, 1998. Proceedings of the IEEE 1998
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-4292-5
DOI :
10.1109/CICC.1998.694988
