• DocumentCode
    2224837
  • Title

    Corner guided curve matching and its application to scene reconstruction

  • Author

    Shan, Ying ; Zhang, Zhengyou

  • Author_Institution
    Microsoft Corp., Redmond, WA, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    796
  • Abstract
    Corners and curves are important image features in many vision-based applications. Corners are usually more stable and easier to match than curves, while curves contain richer information of scene structure. In previously work, corners are often used to recover the epipolar geometry between two views, which is then used in curve matching to reduce the search space. However, information of the scene structure contained in this set of matched corners is ignored. In this paper we present a curve matching algorithm that is guided by a set of matched corners. Within a probabilistic framework, the role of the corner guidance is explicitly defined by a set of similarity-invariant unary measurements and by a similarity function. The similarity function provides stronger capability of resolving matching ambiguity than the epipolar constraint, and is integrated into a relaxation scheme to reduce computational complexity and improve accuracy of curve matching. Experimental results clearly demonstrate the benefit of integrating corner matches into the curve matching procedure
  • Keywords
    computational complexity; computer vision; edge detection; image matching; image reconstruction; stereo image processing; computational complexity; corner guided curve matching; curve matching algorithm; epipolar geometry; image features; matched corners; probabilistic framework; relaxation scheme; scene reconstruction; similarity function; similarity-invariant unary measurements; vision-based applications; Cameras; Computational geometry; Extraterrestrial measurements; Image edge detection; Image reconstruction; Labeling; Layout; Measurement uncertainty; Shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
  • Conference_Location
    Hilton Head Island, SC
  • ISSN
    1063-6919
  • Print_ISBN
    0-7695-0662-3
  • Type

    conf

  • DOI
    10.1109/CVPR.2000.855902
  • Filename
    855902