Title :
Edge based layout compaction
Author :
Chen, Shuilong ; He, Xiangqing ; Yang, Zhilian
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
With the development of circuit design and technology, technology always changes so rapidly that all the layout must be redrawn due to the technology changes, this always takes lots of human labor and consumes a lot of time in tedious layout redrawing. In this paper, an edge based layout reuse (technology migration) technique is proposed; this method uses constraint graph approach and it is different from other constraint graph based compaction algorithms in that it can improve the shape of the layout figures because it is edge based, some badly shaped figures are optimized while design rules are still obeyed. The edge based layout compaction is used for full custom SRAM design and gets a reasonably good result
Keywords :
application specific integrated circuits; circuit layout CAD; constraint theory; graph theory; integrated circuit design; logic CAD; constraint graph approach; design rules; edge based layout compaction; full custom SRAM design; layout figures; layout redrawing; technology migration; Algorithm design and analysis; Circuit synthesis; Compaction; Constraint optimization; Design optimization; Helium; Humans; Image segmentation; Microelectronics; Shape;
Conference_Titel :
ASIC, 2001. Proceedings. 4th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6677-8
DOI :
10.1109/ICASIC.2001.982531
