Title :
Performance analysis of sampling switch structures for wideband sigma-delta noise shapers for RF applications
Author :
Gothenberg, A. ; Tenhunen, H.
Author_Institution :
Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol., Stockholm, Sweden
Abstract :
The sampling switch of a wideband sigma-delta noise shaper for RF applications is a very critical component as any nonlinearities within reduces the spurious free dynamic range, SFDR, of the whole modulator. Errors due to nonlinearities are carried on to all other processing stages. The analysis investigates a variety of sampling switches. It is found that apart from insignificant dependence of input voltage level the bootstrap sampling switch also has a significant higher SFDR over the entire bandwidth
Keywords :
CMOS integrated circuits; bootstrap circuits; cellular radio; digital radio; sigma-delta modulation; signal sampling; CMOS; DCS; GSM; RF applications; SFDR; bootstrap sampling switch; input voltage level; mobile radio systems; nonlinearities; sampling switch structures; spurious free dynamic range; wideband sigma-delta noise shapers; Delta-sigma modulation; Dynamic range; Noise reduction; Noise shaping; Performance analysis; Radio frequency; Sampling methods; Switches; Voltage; Wideband;
Conference_Titel :
ASIC, 2001. Proceedings. 4th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6677-8
DOI :
10.1109/ICASIC.2001.982537
