DocumentCode :
2224966
Title :
Cutting edge sharpness measurement using angle limited total integrated scattering
Author :
Wenyan, Tang
Author_Institution :
Harbin Inst. of Technol., China
fYear :
1993
fDate :
15-19 Nov 1993
Firstpage :
1626
Abstract :
This paper describes a new method for measuring the cutting edge sharpness by using angle limited total integrated scattering (ALTIS). Using this method, the radius of the cutting edges can be measured directly and assessed in numerical quantities. Hypothesizing that the normal cutting edges possess the elliptical profile, the relationship between the radius and the scattered light from the cutting edge is analyzed. Using the diode laser, three metal cutting tools are measured experimentally and the results are compared with those obtained from SEM
Keywords :
cutting; light scattering; machine tools; optical sensors; semiconductor lasers; spatial variables measurement; ALTIS; angle limited total integrated scattering; cutting edge sharpness measurement; diode laser; Cutting tools; Goniometers; Instruments; Light scattering; Manufacturing; Optical microscopy; Optical scattering; Rough surfaces; Scanning electron microscopy; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-0891-3
Type :
conf
DOI :
10.1109/IECON.1993.339316
Filename :
339316
Link To Document :
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