• DocumentCode
    2224966
  • Title

    Cutting edge sharpness measurement using angle limited total integrated scattering

  • Author

    Wenyan, Tang

  • Author_Institution
    Harbin Inst. of Technol., China
  • fYear
    1993
  • fDate
    15-19 Nov 1993
  • Firstpage
    1626
  • Abstract
    This paper describes a new method for measuring the cutting edge sharpness by using angle limited total integrated scattering (ALTIS). Using this method, the radius of the cutting edges can be measured directly and assessed in numerical quantities. Hypothesizing that the normal cutting edges possess the elliptical profile, the relationship between the radius and the scattered light from the cutting edge is analyzed. Using the diode laser, three metal cutting tools are measured experimentally and the results are compared with those obtained from SEM
  • Keywords
    cutting; light scattering; machine tools; optical sensors; semiconductor lasers; spatial variables measurement; ALTIS; angle limited total integrated scattering; cutting edge sharpness measurement; diode laser; Cutting tools; Goniometers; Instruments; Light scattering; Manufacturing; Optical microscopy; Optical scattering; Rough surfaces; Scanning electron microscopy; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-0891-3
  • Type

    conf

  • DOI
    10.1109/IECON.1993.339316
  • Filename
    339316