DocumentCode
2224966
Title
Cutting edge sharpness measurement using angle limited total integrated scattering
Author
Wenyan, Tang
Author_Institution
Harbin Inst. of Technol., China
fYear
1993
fDate
15-19 Nov 1993
Firstpage
1626
Abstract
This paper describes a new method for measuring the cutting edge sharpness by using angle limited total integrated scattering (ALTIS). Using this method, the radius of the cutting edges can be measured directly and assessed in numerical quantities. Hypothesizing that the normal cutting edges possess the elliptical profile, the relationship between the radius and the scattered light from the cutting edge is analyzed. Using the diode laser, three metal cutting tools are measured experimentally and the results are compared with those obtained from SEM
Keywords
cutting; light scattering; machine tools; optical sensors; semiconductor lasers; spatial variables measurement; ALTIS; angle limited total integrated scattering; cutting edge sharpness measurement; diode laser; Cutting tools; Goniometers; Instruments; Light scattering; Manufacturing; Optical microscopy; Optical scattering; Rough surfaces; Scanning electron microscopy; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
Conference_Location
Maui, HI
Print_ISBN
0-7803-0891-3
Type
conf
DOI
10.1109/IECON.1993.339316
Filename
339316
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