• DocumentCode
    2225040
  • Title

    Multilayer backpropagation network for flexible circuit recognition

  • Author

    Suganthan, P.N. ; Teoh, E.K. ; Mital, D.P.

  • Author_Institution
    Gintic Inst. of Manuf. Technol., Nanyang Technol. Univ., Singapore
  • fYear
    1993
  • fDate
    15-19 Nov 1993
  • Firstpage
    1645
  • Abstract
    This paper presents an industrial application of the multilayer backpropagation neural network with a modified learning rule, in recognizing transparent flexible membrane printed circuits independent of the position, orientation and scale. We give a new learning algorithm which reduces the complexity of the multilayer backpropagation network by pruning insignificant weights and chooses the best size to suit the underlying complexity of the recognition problem. This new learning algorithm is also compared with other network redundancy reduction techniques and tested on 3-bit parity problem. In this particular application, moment invariant features were chosen to train the multilayer backpropagation network. As the circuits have regular shape with a limited number of corners, a fast corner based moment invariance estimation algorithm is employed. This algorithm is almost hundred times faster than standard occupancy array based algorithm for shapes with a small number of corners
  • Keywords
    backpropagation; computer vision; feature extraction; feedforward neural nets; printed circuit manufacture; redundancy; 3-bit parity problem; fast corner based moment invariance estimation; flexible circuit recognition; flexible membrane printed circuits; learning rule; moment invariant features; multilayer backpropagation neural network; network redundancy reduction; Artificial neural networks; Backpropagation algorithms; Fault tolerance; Flexible printed circuits; Intelligent robots; Multi-layer neural network; Neural networks; Noise robustness; Nonhomogeneous media; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-0891-3
  • Type

    conf

  • DOI
    10.1109/IECON.1993.339320
  • Filename
    339320