Title :
Yield improvement by redundancy method for component calibration
Author :
Enikeeva, F. ; Morche, Dominique ; Oguz, A.
Author_Institution :
LJK, UJF, Grenoble, France
Abstract :
The benefits of a redundant channels methodology for the component calibration are explored. Proposed is a normal approximation of the yield in order to estimate the number of redundant components needed to provide a minimal area occupied by the components.
Keywords :
approximation theory; calibration; component calibration; redundant channel methodology; yield normal approximation improvement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2012.4170
