Title :
Reconstructing optical parameters of planar structures by fringe analysis
Author_Institution :
Loughborough Univ. of Technol., UK
Abstract :
The reconstruction of a set of quantitative parameters from measurements of scattered field intensity is addressed for planar dielectric structures. The information in the scattered field is encoded into conventional interference fringe patterns. A computer simulation for optical illumination is presented in the context of quantitative nondestructive evaluation and the stability to additive noise is investigated
Keywords :
light interferometry; light scattering; picture processing; computer simulation; fringe analysis; interference fringe patterns; nondestructive evaluation; optical illumination; optical parameters; planar structures; quantitative parameters; scattered field intensity;
Conference_Titel :
Holographic Systems, Components and Applications, 1991., Third International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
0-85296-528-1
