• DocumentCode
    2225790
  • Title

    Plasmon coupled tip-enhanced near-field optical microscopy

  • Author

    Bouhelier, A. ; Beversluis ; Novotny

  • Author_Institution
    Inst. of Opt., Rochester Univ., NY, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    134
  • Abstract
    Summary form only given. Scanning near-field optical microscopy aims at optically resolving subwavelength structures. The most common technique relies on the local excitation of the sample surface by the optical fields near a nano-aperture which is commonly produced at the end of a glass fiber tip. Alternatively, high resolution microscopy can also be achieved by using the local field enhancement produced at the end of a sharp metal tip when illuminated by a highly focused laser beam. By combining these techniques in the form of a sharp metal tip at the end of an overcoated fiber, we propose a new method that does not require the delicate technologies to produce nano-apertures, nor require the intense external focused beam responsible for the field enhancement.
  • Keywords
    near-field scanning optical microscopy; surface plasmons; cut-off point; evanescent field; high resolution microscopy; linearly polarized mode; local field enhancement; nano-apertures; overcoated fiber; plasmon coupled tip-enhanced microscopy; scanning near-field optical microscopy; sharp metal tip; subwavelength structures; surface plasmons; Plasmons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Long Beach, CA, USA
  • Print_ISBN
    1-55752-708-3
  • Type

    conf

  • DOI
    10.1109/QELS.2002.1031211
  • Filename
    1031211