DocumentCode
2225790
Title
Plasmon coupled tip-enhanced near-field optical microscopy
Author
Bouhelier, A. ; Beversluis ; Novotny
Author_Institution
Inst. of Opt., Rochester Univ., NY, USA
fYear
2002
fDate
19-24 May 2002
Firstpage
134
Abstract
Summary form only given. Scanning near-field optical microscopy aims at optically resolving subwavelength structures. The most common technique relies on the local excitation of the sample surface by the optical fields near a nano-aperture which is commonly produced at the end of a glass fiber tip. Alternatively, high resolution microscopy can also be achieved by using the local field enhancement produced at the end of a sharp metal tip when illuminated by a highly focused laser beam. By combining these techniques in the form of a sharp metal tip at the end of an overcoated fiber, we propose a new method that does not require the delicate technologies to produce nano-apertures, nor require the intense external focused beam responsible for the field enhancement.
Keywords
near-field scanning optical microscopy; surface plasmons; cut-off point; evanescent field; high resolution microscopy; linearly polarized mode; local field enhancement; nano-apertures; overcoated fiber; plasmon coupled tip-enhanced microscopy; scanning near-field optical microscopy; sharp metal tip; subwavelength structures; surface plasmons; Plasmons;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location
Long Beach, CA, USA
Print_ISBN
1-55752-708-3
Type
conf
DOI
10.1109/QELS.2002.1031211
Filename
1031211
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