DocumentCode :
2227627
Title :
Flip-chip X-band operation of thermally-shunted microwave HBT´s with sub-micron emitters
Author :
Bayraktaroglu, B. ; Ali, F. ; Mason, J. ; Smith, P.
Author_Institution :
Westinghouse Electr. Corp., Baltimore, MD, USA
Volume :
2
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
685
Abstract :
Design and fabrication methods were developed for GaAs-based flip-chip HBTs with emitter sizes down to 1 /spl mu/m or less. We have fabricated and tested identical size devices in both the conventional and the flip-chip configuration on the same wafer to make a direct comparison of their DC, microwave, and thermal properties. It was shown that flip-chip mounted microwave HBTs can produce the same or better electrical performance than their conventional upright counterparts while offering a 37% improvement in thermal resistance.
Keywords :
III-V semiconductors; flip-chip devices; gallium arsenide; heterojunction bipolar transistors; microwave bipolar transistors; thermal resistance; 1 micron; DC properties; GaAs; GaAs-based flip-chip HBTs; X-band operation; fabrication method; microwave properties; submicron emitters; thermal properties; thermal resistance; thermally-shunted microwave HBT; Electric resistance; Electromagnetic heating; Fabrication; Fingers; Heterojunction bipolar transistors; Microwave devices; Resistance heating; Testing; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3246-6
Type :
conf
DOI :
10.1109/MWSYM.1996.511032
Filename :
511032
Link To Document :
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