DocumentCode
2227627
Title
Flip-chip X-band operation of thermally-shunted microwave HBT´s with sub-micron emitters
Author
Bayraktaroglu, B. ; Ali, F. ; Mason, J. ; Smith, P.
Author_Institution
Westinghouse Electr. Corp., Baltimore, MD, USA
Volume
2
fYear
1996
fDate
17-21 June 1996
Firstpage
685
Abstract
Design and fabrication methods were developed for GaAs-based flip-chip HBTs with emitter sizes down to 1 /spl mu/m or less. We have fabricated and tested identical size devices in both the conventional and the flip-chip configuration on the same wafer to make a direct comparison of their DC, microwave, and thermal properties. It was shown that flip-chip mounted microwave HBTs can produce the same or better electrical performance than their conventional upright counterparts while offering a 37% improvement in thermal resistance.
Keywords
III-V semiconductors; flip-chip devices; gallium arsenide; heterojunction bipolar transistors; microwave bipolar transistors; thermal resistance; 1 micron; DC properties; GaAs; GaAs-based flip-chip HBTs; X-band operation; fabrication method; microwave properties; submicron emitters; thermal properties; thermal resistance; thermally-shunted microwave HBT; Electric resistance; Electromagnetic heating; Fabrication; Fingers; Heterojunction bipolar transistors; Microwave devices; Resistance heating; Testing; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.511032
Filename
511032
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