• DocumentCode
    2227627
  • Title

    Flip-chip X-band operation of thermally-shunted microwave HBT´s with sub-micron emitters

  • Author

    Bayraktaroglu, B. ; Ali, F. ; Mason, J. ; Smith, P.

  • Author_Institution
    Westinghouse Electr. Corp., Baltimore, MD, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    685
  • Abstract
    Design and fabrication methods were developed for GaAs-based flip-chip HBTs with emitter sizes down to 1 /spl mu/m or less. We have fabricated and tested identical size devices in both the conventional and the flip-chip configuration on the same wafer to make a direct comparison of their DC, microwave, and thermal properties. It was shown that flip-chip mounted microwave HBTs can produce the same or better electrical performance than their conventional upright counterparts while offering a 37% improvement in thermal resistance.
  • Keywords
    III-V semiconductors; flip-chip devices; gallium arsenide; heterojunction bipolar transistors; microwave bipolar transistors; thermal resistance; 1 micron; DC properties; GaAs; GaAs-based flip-chip HBTs; X-band operation; fabrication method; microwave properties; submicron emitters; thermal properties; thermal resistance; thermally-shunted microwave HBT; Electric resistance; Electromagnetic heating; Fabrication; Fingers; Heterojunction bipolar transistors; Microwave devices; Resistance heating; Testing; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.511032
  • Filename
    511032