Title :
The design of a novel low-power and high-precision voltage testing circuit
Author :
Nailong, Wang ; Runde, Zhou ; Yuanqing, Ge
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
This paper presents the design of a novel low-power and high-precision voltage testing circuit. The circuit consists of a temperature-insensitive reference voltage generator and a voltage follower to eliminate the loading effect. The circuit has been fabricated in 0.8 μm CMOS technology and its performance has been measured, which shows that the circuit functions are consistence with the theoretical analysis and Spice simulation
Keywords :
CMOS integrated circuits; circuit feedback; integrated circuit testing; low-power electronics; power supply circuits; reference circuits; voltage measurement; 0.8 micron; CMOS technology; high-precision voltage testing circuit; low-power voltage testing circuit; power supply voltage testing; reference voltage generator; temperature-insensitive voltage generator; voltage follower; CMOS technology; Circuit simulation; Circuit testing; MOSFETs; Microelectronics; Power supplies; Resistors; Signal design; Temperature dependence; Voltage;
Conference_Titel :
ASIC, 2001. Proceedings. 4th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-6677-8
DOI :
10.1109/ICASIC.2001.982644
