DocumentCode :
2227728
Title :
Spectral differences of opposite sides of stripe rust infested winter wheat leaves using ASD´s Leaf Clip
Author :
Zhao, Jinling ; Yuan, Lin ; Luo, Juhua ; Du, Shizhou ; Huang, Linsheng ; Huang, Wenjiang
Author_Institution :
Beijing Res. Center for Inf. Technol. in Agric., Beijing, China
fYear :
2012
fDate :
22-27 July 2012
Firstpage :
6585
Lastpage :
6588
Abstract :
Stripe Rust, caused by Puccinia striiformis f. sp. tritici, has emerged as one of the most destructive foliar diseases of winter wheat (Triticum aestivum L.) and caused great yield loss. The primary objective of this study is to identify the stress characteristics of wheat leaves caused by such a disease. After performing artificial inoculation of stripe rust, hundreds of leaves with different infections were collected and leaf reflectance were conducted using ASD´s (Analytical Spectral Devices) leaf clip probe. Based on the nonequivalent optical properties on the opposite side of a leaf, their spectral characteristics were specifically compared and the correlations between disease severity indices and water or chlorophyll were further analyzed. The final results indicated that, for the face and back sides of stripe rust infected wheat leaves, some obvious differences existed in the spectral reflectance and correlation curves between foliar disease severity indexes (FDSIs) and reflectance, especially with the increase of infections.
Keywords :
crops; diseases; remote sensing; ASD leaf clip; Analytical Spectral Devices; Puccinia striiformis; Triticum aestivum L; artificial inoculation; foliar disease severity index; leaf reflectance; spectral difference; stress characteristics; stripe rust infested winter wheat leaves; yield loss; Agriculture; Correlation; Diseases; Face; Indexes; Reflectivity; Remote sensing; ASD Leaf Clip; Foliar disease severity index (FDSI); Leaf reflectance measurement; Stripe rust disease; Winter wheat;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
ISSN :
2153-6996
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2012.6352090
Filename :
6352090
Link To Document :
بازگشت