• DocumentCode
    2227779
  • Title

    A novel reliable routing algorithm for network on chips

  • Author

    Aliabadi, M.R. ; Khademzadeh, A. ; Raiyat, M.A.

  • Author_Institution
    Iran Telecommun. Res. Center, Tehran, Iran
  • fYear
    2008
  • fDate
    8-11 Dec. 2008
  • Firstpage
    1375
  • Lastpage
    1379
  • Abstract
    As technology scales, fault tolerance is becoming a key concern in on-chip communication. In this paper we present a methodology to design fault-tolerant routing algorithms for regular direct interconnection networks. It supports fully adaptive routing, does not degrade performance in the absence of faults, and supports a reasonably large number of faults without significantly degrading performance. Consequently, this work examines fault tolerant communication algorithms for use in the NoC domain. Before two different flooding algorithms, a random walk algorithm and an Intermediate Node Algorithm have been investigated. The first three algorithms have an exceedingly high communication overhead and cause huge congestion in usual traffics. The fourth is a static fault model which focuses on the faults knowing in advance where they are located. We have developed a new dynamic algorithm based on intermediate node concept and stress value concept to overcome all of mentioned constraints.
  • Keywords
    fault tolerance; multiprocessor interconnection networks; network routing; network-on-chip; fault tolerance; network-on-chip; regular direct interconnection network; reliable routing algorithm; Algorithm design and analysis; Degradation; Design methodology; Fault tolerance; Floods; Multiprocessor interconnection networks; Network-on-a-chip; Routing; Telecommunication network reliability; Traffic control; Congestion; Faults; Performance; Reliability; Routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2629-4
  • Electronic_ISBN
    978-1-4244-2630-0
  • Type

    conf

  • DOI
    10.1109/IEEM.2008.4738095
  • Filename
    4738095