DocumentCode
2228271
Title
Synthesis and structural properties of ZnS nanostructures
Author
Kurbatov, D.I. ; Opanasyuk, A.S. ; Sofronov, D.S. ; Danilchenko, S.M. ; Protsenko, I.Y.
Author_Institution
Sumy State Univ., Sumy, Ukraine
fYear
2011
fDate
12-16 Sept. 2011
Firstpage
747
Lastpage
748
Abstract
In this work the technology of deposition of ZnS nanostructures obtained by close-spaced vacuum sublimation technique (CSVS) is described. The some structural properties of these nanostructures are investigated. Examination of layers morphology and structure was performed by high-resolution electron microscopy and X-ray diffraction method respectively. Results of these studies enabled to determine dependence of the main structural film parameters (phase, lattice parameters, grain sizes etc.) on the growth conditions.
Keywords
II-VI semiconductors; X-ray diffraction; nanofabrication; nanostructured materials; semiconductor growth; semiconductor thin films; sublimation; vacuum deposition; zinc compounds; X-ray diffraction method; ZnS; close-spaced vacuum sublimation technique; grain size; high-resolution electron microscopy; layers morphology; nanostructures; structural film parameters; structural properties; Films; Lattices; Nanostructures; Substrates; X-ray diffraction; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4577-0883-1
Type
conf
Filename
6069134
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