• DocumentCode
    2228309
  • Title

    Investigation of nanostructured silicon surfaces using fractal analysis

  • Author

    Smyntyna, V.A. ; Kulinich, O.A. ; Iatsunskyi, I.R. ; Marchuk, I.A. ; Pavlenko, N.N.

  • Author_Institution
    Fac. of Phys., Odessa I.I. Mechnikov Nat. Univ., Odessa, Ukraine
  • fYear
    2011
  • fDate
    12-16 Sept. 2011
  • Firstpage
    753
  • Lastpage
    754
  • Abstract
    Fractal analysis was applied to images of nanostructured silicon surfaces which were acquired with a scanning electron microscope. A fractal model describing nanostructured silicon surfaces morphology is elaborated. It were obtained the numerical results for the fractal dimensions for 2 samples with different nanostructured shapes.
  • Keywords
    elemental semiconductors; fractals; nanostructured materials; numerical analysis; scanning electron microscopy; silicon; surface morphology; Si; fractal analysis; fractal dimensions; fractal model; nanostructured silicon surfaces; numerical analysis; scanning electron microscopy; surface morphology; Fractals; Nanobioscience; Shape; Silicon; Surface morphology; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4577-0883-1
  • Type

    conf

  • Filename
    6069136
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2228309