Inverse problem solving for layered dielectric structure using Newton-Kantorovich iterative scheme with increased accuracy

A new approach to permittivity profile reconstruction based on Newton-Kantorovich iterative scheme is considered. The novelty of the investigation is concerned with a new treatment with the problem of reflecting interfaces localization. The problem is ruled by a technique composing parametrical spectral analysis and approximate reconstruction by the scheme using exponential basis for the purpose of permittivity profile representation. Improvement of reconstruction accuracy is shown numerically.