Title :
An Immune Fault Detection System with Automatic Detector Generation by Genetic Algorithms
Author :
Amaral, Jorge L M ; Amaral, José F M ; Morin, Daniel ; Tanscheit, Ricardo
Author_Institution :
Rio de Janeiro State Univ., Rio de Janeiro
Abstract :
This work deals with fault detection of electronic analog circuits. A fault detection system for analog circuits based on cross-correlation and artificial immune systems is proposed. It is capable of detecting faulty components in analog circuits by analyzing its impulse response. The use of cross-correlation for preprocessing the impulse response drastically reduces the size of the detector used by the real-valued negative selection algorithm (RNSA). The proposed method makes use of genetic algorithms to automatically generate a small number of very efficient detectors. Results have demonstrated that the proposed system is able to detect faults in a Sallen-Key bandpass filter and in a universal filter.
Keywords :
analogue circuits; artificial immune systems; band-pass filters; fault location; genetic algorithms; transient response; Sallen-Key bandpass filter; artificial immune systems; automatic detector generation; cross-correlation; electronic analog circuits; genetic algorithms; immune fault detection system; impulse response; real-valued negative selection algorithm; Analog circuits; Artificial immune systems; Circuit faults; Circuit testing; Detectors; Electrical fault detection; Fault detection; Fault diagnosis; Genetic algorithms; Immune system;
Conference_Titel :
Intelligent Systems Design and Applications, 2007. ISDA 2007. Seventh International Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-0-7695-2976-9
DOI :
10.1109/ISDA.2007.116