Title :
An efficient approach to device parameter extraction for statistical IC modeling
Author :
Qu, Ming ; Styblinski, M.A.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
Abstract :
A technique called Recursive Inverse Approximation (RIA) has been developed for parameter extraction for statistical IC modeling. High accuracy and efficiency are achieved by the proposed methodology. RIA combines the global optimization, parameter prediction, parameter correction, and accuracy checking. RIA fundamentally solves the accuracy problem in statistical IC parameter extraction. The proposed method is much faster than the optimization-based method. The technique was implemented in SMIC - a program for statistical modeling of integrated circuits
Keywords :
circuit analysis computing; circuit optimisation; integrated circuit design; integrated circuit modelling; parameter estimation; statistical analysis; SMIC; accuracy checking; device parameter extraction; efficiency; global optimization; parameter correction; parameter prediction; recursive inverse approximation; statistical IC modeling; Application specific integrated circuits; Data mining; Equations; Integrated circuit measurements; Integrated circuit modeling; Noise level; Parameter extraction; Particle measurements; Performance evaluation;
Conference_Titel :
Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-3117-6
DOI :
10.1109/CICC.1996.511091
