Title :
Compensated layout for automated accurate common-centroid capacitor arrays
Author :
Khalil, DiaaEldin ; Dessouky, Mohamed ; Bourguet, Vincent ; Louera, Marie-Minewe ; Cathelin, Andreia ; Ragai, Hani
Author_Institution :
Ain Shams University
Keywords :
Analog circuits; Automatic testing; Capacitance; Capacitors; Circuit testing; Fabrication; Geometry; Laboratories; Research and development; Semiconductor device measurement;
Conference_Titel :
Electrical, Electronic and Computer Engineering, 2004. ICEEC '04. 2004 International Conference on
Print_ISBN :
0-7803-8575-6
DOI :
10.1109/ICEEC.2004.1374505