Title :
Thickness measurement of multi-layered structures: a neural net approach
Author :
Harrouche, K. ; Derouiche, Ziane ; Rouvaen, J.M. ; Delebarre, C.
Author_Institution :
CNRS, Valenciennes Univ.
fDate :
31 Oct-3 Nov 1993
Abstract :
In our laboratory we got some experience about the high frequency characterisation of heteregeneous and multilayered structures. Several tools have been developed for this purpose. Our aim is to apply a neural net approach to this problem. Suitable neural net structures are designed for performing this task. Simulated echograms are used as inputs in the learning phase and then in the operating one
Keywords :
acoustic imaging; acoustic signal processing; backpropagation; neural nets; thickness measurement; ultrasonic scattering; echograms; heteregeneous; learning; multilayered structures; neural net; thickness measurement; Acoustic waves; Additive noise; Backpropagation algorithms; Biomedical signal processing; Frequency; Laboratories; Multi-layer neural network; Neural networks; Neurons; Thickness measurement;
Conference_Titel :
Ultrasonics Symposium, 1993. Proceedings., IEEE 1993
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2012-3
DOI :
10.1109/ULTSYM.1993.339513
