• DocumentCode
    2230122
  • Title

    Genetic algorithm based diode model prameters extraction

  • Author

    Almashary, Bandar

  • Author_Institution
    King Saud University
  • fYear
    2004
  • fDate
    5-7 Sept. 2004
  • Firstpage
    545
  • Lastpage
    548
  • Keywords
    Circuit simulation; Circuit synthesis; Circuit testing; Condition monitoring; Data mining; Genetic algorithms; Optimization methods; P-n junctions; Robustness; Schottky diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical, Electronic and Computer Engineering, 2004. ICEEC '04. 2004 International Conference on
  • Print_ISBN
    0-7803-8575-6
  • Type

    conf

  • DOI
    10.1109/ICEEC.2004.1374526
  • Filename
    1374526
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2230122