Title :
Investigation of temperature and frequency dependences of dielectric characteristics of bulk dielectrics and semiconductors
Author :
Golovashchenko, R.V. ; Goroshko, O.V. ; Derkach, V.N. ; Korzh, V.G. ; Tarapov, S.I.
Author_Institution :
Usikov Inst. of Radiophys. & Electron., Kharkov, Ukraine
Abstract :
Investigation of some dielectric and semiconductor materials in the millimeter waveband and temperature range from helium to room temperature is carried out. The technique using the open disk resonator with whispering gallery modes was used. The character of the behavior of permittivity and loss tangent of materials is determined. Comparative analysis of the results is performed.
Keywords :
dielectric materials; helium; permittivity; semiconductor materials; He; bulk dielectrics; dielectric characteristics; frequency dependence investigation; loss tangent; millimeter waveband; open disk resonator; permittivity; semiconductor material; temperature 293 K to 298 K; temperature dependence investigation; Dielectrics; Materials; Permittivity; Resonant frequency; Temperature distribution; Whispering gallery modes;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
