DocumentCode
2230540
Title
Effects of non-uniform distribution of motion on determinations of piezoelectric coupling and constants using IEEE 176-1987
Author
Kosinski, J.A. ; Ballato, A. ; Lu, Yang
Author_Institution
US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ
fYear
1993
fDate
31 Oct-3 Nov 1993
Firstpage
537
Abstract
The critical frequencies of practical plate resonators are not determined by the intrinsic or “theoretical” values of mass loading and piezoelectric coupling, but by “effective” values owing to the nonuniform distribution of vibratory motion across the plate. The non-uniform distribution of motion effects are not accounted for in the IEEE 176-1987 recommended thin plate measurement methods for determining piezoelectric coupling and constants. Further, the calculations required to correct measured data for the non-uniform distribution of motion effects are non-trivial. Consequently, a measurement approach in which the distribution of motion plays no part has been developed
Keywords
crystal resonators; piezoelectric oscillations; IEEE 176-1987; critical frequencies; mass loading; motion effects; nonuniform distribution; piezoelectric constants; piezoelectric coupling; practical plate resonators; vibratory motion; Capacitance measurement; Frequency measurement; Measurement standards; Motion analysis; Motion measurement; Piezoelectric materials; Resonance; Resonant frequency; Testing; Vibration measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1993. Proceedings., IEEE 1993
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-2012-3
Type
conf
DOI
10.1109/ULTSYM.1993.339552
Filename
339552
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