• DocumentCode
    2230540
  • Title

    Effects of non-uniform distribution of motion on determinations of piezoelectric coupling and constants using IEEE 176-1987

  • Author

    Kosinski, J.A. ; Ballato, A. ; Lu, Yang

  • Author_Institution
    US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ
  • fYear
    1993
  • fDate
    31 Oct-3 Nov 1993
  • Firstpage
    537
  • Abstract
    The critical frequencies of practical plate resonators are not determined by the intrinsic or “theoretical” values of mass loading and piezoelectric coupling, but by “effective” values owing to the nonuniform distribution of vibratory motion across the plate. The non-uniform distribution of motion effects are not accounted for in the IEEE 176-1987 recommended thin plate measurement methods for determining piezoelectric coupling and constants. Further, the calculations required to correct measured data for the non-uniform distribution of motion effects are non-trivial. Consequently, a measurement approach in which the distribution of motion plays no part has been developed
  • Keywords
    crystal resonators; piezoelectric oscillations; IEEE 176-1987; critical frequencies; mass loading; motion effects; nonuniform distribution; piezoelectric constants; piezoelectric coupling; practical plate resonators; vibratory motion; Capacitance measurement; Frequency measurement; Measurement standards; Motion analysis; Motion measurement; Piezoelectric materials; Resonance; Resonant frequency; Testing; Vibration measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1993. Proceedings., IEEE 1993
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-2012-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1993.339552
  • Filename
    339552