DocumentCode
2230816
Title
A computer integrated manufacturing system for excursion management
Author
Patel, Divyesh N. ; Core, Dan ; Nguyen, Hai N. ; Martin, Glen ; Mooney, Kathleen ; Neri, Greg ; Cresswell, Duncan
Author_Institution
Intel Corp., Rio Rancho, NM, USA
fYear
1996
fDate
12-14 Nov 1996
Firstpage
23
Lastpage
25
Abstract
The current virtual factory excursion management system has proven itself in high volume manufacturing fabs and is flexible enough for continuous improvement. All system components described in this paper have successfully passed the ISO9002 surveillance. The material containment utility has allowed no escapes across the virtual factory. The Access DB is widely used to generate the health indicators of functional area or a factory. Automated reports help planning in meeting their output commitments by identifying material at risk in a factory. Periodic audit of this system will help in maintaining synergy across the virtual factory and help drive continuous line yield and die yield improvements in the virtual factory through shared learning
Keywords
ISO standards; computer integrated manufacturing; integrated circuit yield; quality control; ISO9002 surveillance; computer integrated manufacturing system; continuous line yield; die yield improvements; excursion management; functional area; health indicators; high volume manufacturing fabs; output commitments; shared learning; virtual factory; Computer integrated manufacturing; Databases; Guidelines; Management training; Marine vehicles; Production facilities; Risk management; Semiconductor device manufacture; Semiconductor materials; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
0-7803-3371-3
Type
conf
DOI
10.1109/ASMC.1996.557965
Filename
557965
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