• DocumentCode
    2230816
  • Title

    A computer integrated manufacturing system for excursion management

  • Author

    Patel, Divyesh N. ; Core, Dan ; Nguyen, Hai N. ; Martin, Glen ; Mooney, Kathleen ; Neri, Greg ; Cresswell, Duncan

  • Author_Institution
    Intel Corp., Rio Rancho, NM, USA
  • fYear
    1996
  • fDate
    12-14 Nov 1996
  • Firstpage
    23
  • Lastpage
    25
  • Abstract
    The current virtual factory excursion management system has proven itself in high volume manufacturing fabs and is flexible enough for continuous improvement. All system components described in this paper have successfully passed the ISO9002 surveillance. The material containment utility has allowed no escapes across the virtual factory. The Access DB is widely used to generate the health indicators of functional area or a factory. Automated reports help planning in meeting their output commitments by identifying material at risk in a factory. Periodic audit of this system will help in maintaining synergy across the virtual factory and help drive continuous line yield and die yield improvements in the virtual factory through shared learning
  • Keywords
    ISO standards; computer integrated manufacturing; integrated circuit yield; quality control; ISO9002 surveillance; computer integrated manufacturing system; continuous line yield; die yield improvements; excursion management; functional area; health indicators; high volume manufacturing fabs; output commitments; shared learning; virtual factory; Computer integrated manufacturing; Databases; Guidelines; Management training; Marine vehicles; Production facilities; Risk management; Semiconductor device manufacture; Semiconductor materials; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-3371-3
  • Type

    conf

  • DOI
    10.1109/ASMC.1996.557965
  • Filename
    557965