Material characterization using Hertzian point contact transducers

Author

Degertekin, F. Levent ; Jun Pei ; Khuri-Yakub, Butrus T.

Author_Institution

Edward L. Ginzton Lab., Stanford Univ., CA

fYear

1993

fDate

31 Oct-3 Nov 1993

Firstpage

297

Abstract

Non-destructive Hertzian contacts are used to couple ultrasonic waves for characterization and defect detection in anisotropic solid plates. Spring loaded quartz rods bonded to PZT-5H transducers are used to form a point source-point receiver pair and ultrasonic plate modes are excited and detected around 200 KHz with a 50 dB signal to noise ratio at the receiving end. Measurements are performed on silicon wafers and various graphite-epoxy composite plates. The direction dependence and dispersion curves of the zeroth order antisymmetric Lamb wave are measured and excellent agreement with theoretical calculations is observed

Keywords

carbon fibre reinforced composites; elemental semiconductors; graphite; lead compounds; piezoelectric materials; piezoelectric transducers; silicon; ultrasonic materials testing; ultrasonic transducers; ultrasonic velocity; ultrasonic velocity measurement; C; Hertzian point contact transducers; PZT-5H transducers; Si; Si wafers; graphite-epoxy composite plates; point source-point receiver; quartz rods; semiconductor; ultrasonic plate modes; zeroth order antisymmetric Lamb wave; Anisotropic magnetoresistance; Dispersion; Performance evaluation; Signal to noise ratio; Silicon; Solids; Springs; Ultrasonic transducers; Ultrasonic variables measurement; Wafer bonding;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1993. Proceedings., IEEE 1993

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-2012-3

Type

conf

DOI

10.1109/ULTSYM.1993.339568

Filename

339568