Title :
Material characterization using Hertzian point contact transducers
Author :
Degertekin, F. Levent ; Jun Pei ; Khuri-Yakub, Butrus T.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA
fDate :
31 Oct-3 Nov 1993
Abstract :
Non-destructive Hertzian contacts are used to couple ultrasonic waves for characterization and defect detection in anisotropic solid plates. Spring loaded quartz rods bonded to PZT-5H transducers are used to form a point source-point receiver pair and ultrasonic plate modes are excited and detected around 200 KHz with a 50 dB signal to noise ratio at the receiving end. Measurements are performed on silicon wafers and various graphite-epoxy composite plates. The direction dependence and dispersion curves of the zeroth order antisymmetric Lamb wave are measured and excellent agreement with theoretical calculations is observed
Keywords :
carbon fibre reinforced composites; elemental semiconductors; graphite; lead compounds; piezoelectric materials; piezoelectric transducers; silicon; ultrasonic materials testing; ultrasonic transducers; ultrasonic velocity; ultrasonic velocity measurement; C; Hertzian point contact transducers; PZT-5H transducers; Si; Si wafers; graphite-epoxy composite plates; point source-point receiver; quartz rods; semiconductor; ultrasonic plate modes; zeroth order antisymmetric Lamb wave; Anisotropic magnetoresistance; Dispersion; Performance evaluation; Signal to noise ratio; Silicon; Solids; Springs; Ultrasonic transducers; Ultrasonic variables measurement; Wafer bonding;
Conference_Titel :
Ultrasonics Symposium, 1993. Proceedings., IEEE 1993
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2012-3
DOI :
10.1109/ULTSYM.1993.339568
