DocumentCode
2231073
Title
Description of settlement patterns using VHR SAR data of the German TanDEM-X mission
Author
Esch, Thomas ; Heldens, Wieke ; Felbier, Andreas ; Taubenböck, Hannes ; Roth, Achim
Author_Institution
German Remote Sensing Data Center, German Aerosp. Center, Wessling, Germany
fYear
2012
fDate
22-27 July 2012
Firstpage
5737
Lastpage
5740
Abstract
The German earth observation mission TanDEM-X (TerraSAR-X add-on for Digital Elevation Measurement) is collecting a total of two global coverages of very high resolution (VHR) synthetic aperture radar (SAR) X-band data with a spatial resolution of around three meters in the years 2011 and 2012. This paper outlines the capabilities of this data set in terms of supporting the analysis and monitoring of global human settlement patterns. The basic methodology for a fully-operational detection and delineation of built-up areas from VHR SAR data is presented along with a description of the resulting urban footprint (UF) masks and the operational processing environment for the UF production. The preliminary results of the global UF generation indicate the high potential of the TanDEM-X mission (TDM) with respect to the mapping of urbanization patterns as a basis for the analysis of urban sprawl, peri-urbanization or population estimation.
Keywords
geophysical image processing; geophysical techniques; image classification; radar imaging; remote sensing by radar; synthetic aperture radar; AD 2011; AD 2012; German Earth observation mission; German TANDEM-X mission; SAR X-band data; VHR SAR data; global human settlement patterns; operational processing environment; peri-urbanization; population estimation; settlement pattern description; synthetic aperture radar; urban footprint masks; urban sprawl; urbanization pattern mapping; Backscatter; Computed tomography; Image texture; Spatial resolution; Speckle; Synthetic aperture radar; Urban areas; TanDEM-X; automation; global mapping; settlement patterns; urbanization;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location
Munich
ISSN
2153-6996
Print_ISBN
978-1-4673-1160-1
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2012.6352308
Filename
6352308
Link To Document