• DocumentCode
    2231860
  • Title

    Directional degradation of spectralon diffuser under ionizing radiation for calibration of space-based sensors

  • Author

    Georgiev, G.T. ; Butler, J.J. ; Kowalewski, M.G. ; Ding, L.

  • Author_Institution
    Sigma Space Corp., Lanham, MD, USA
  • fYear
    2012
  • fDate
    22-27 July 2012
  • Firstpage
    4726
  • Lastpage
    4729
  • Abstract
    Assessment of the effect of Vacuum Ultra Violet (VUV) irradiation on the Bidirectional Reflectance Distribution Function (BRDF) of Spectralon is presented in this paper. The sample was a 99% white Spectralon calibration standard irradiated with VUV source positioned at 60° off the irradiation direction for a total of 20 hours. The BRDF before and after VUV irradiation was measured and compared at number of wavelengths in the UV, VIS and IR. Non-isotropic directional degradation of Spectralon diffuser under ionizing radiation was detected at different BRDF measurement geometries primarily at UV spectral range. The 8° directional/hemispherical reflectance of the same sample was also measured and compared from 200nm to 2500nm.
  • Keywords
    calibration; geophysical equipment; geophysical techniques; radiometry; remote sensing; ultraviolet radiation effects; BRDF measurement geometry; IR wavelength; MODIS; Spectralon diffuser; UV spectral range; UV wavelength; VUV irradiation effect assessment; VUV source; bidirectional reflectance distribution function; hemispherical reflectance; ionizing radiation; irradiation direction; nonisotropic directional degradation; of space-based sensor calibration; time 20 hour; vacuum ultraviolet irradiation; visible wavelength; wavelength 200 nm to 2500 nm; white Spectralon calibration standard; Calibration; Degradation; Extraterrestrial measurements; Pollution measurement; Radiation effects; Reflectivity; Wavelength measurement; BRDF; Multiangular; Reflectance; Remote Sensing; Spectralon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
  • Conference_Location
    Munich
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4673-1160-1
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2012.6352337
  • Filename
    6352337