Title :
Mixed-signal calibration of pipelined analog-digital converters
Author :
Sonkusale, Sameer ; Van der Spiegel, Jan
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A least-mean-squares (LMS) based mixed-signal scheme for the self-calibration of a pipelined analog-digital converter (ADC) is proposed. The technique uses an elegant continuous reference update algorithm to correct for gain errors and offset errors in a pipeline stage with minimal area and power overhead. Simulation results show the efficiency of the scheme for resolution of greater than 13 bits in a CMOS process.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; circuit simulation; error correction; integrated circuit design; least mean squares methods; mixed analogue-digital integrated circuits; pipeline processing; ADC mixed-signal calibration; CMOS; LMS; continuous reference update algorithm; gain error correction; least-mean-squares self-calibration scheme; offset error correction; pipelined analog-digital converters; Analog-digital conversion; CMOS technology; Calibration; Capacitors; Circuits; Error correction; Operational amplifiers; Pipelines; Signal resolution; Voltage;
Conference_Titel :
SOC Conference, 2003. Proceedings. IEEE International [Systems-on-Chip]
Print_ISBN :
0-7803-8182-3
DOI :
10.1109/SOC.2003.1241536
