Title :
Bifurcation phenomena in the Colpitts oscillator: a robustness analysis
Author :
Feo, Oscar De ; Maggio, Gian Mario
Author_Institution :
Dept. of Electr. Eng., Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Abstract :
A robustness assessment for the results of a bifurcation analysis of the Colpitts oscillator is presented. It is shown, by means of SPICE simulations, that the bifurcation phenomena occurring in the oscillator are relatively independent of the particular choice of the transistor model. Furthermore, the simulation results exhibit good agreement with the theoretical predictions. It is also demonstrated, through circuit experiments, that the predicted behaviors can be reproduced experimentally in a robust way
Keywords :
Bifurcation; Circuit simulation; Nonlinear network analysis; SPICE; Voltage-controlled oscillators; Colpitts oscillator; SPICE simulations; bifurcation phenomena; robustness analysis; transistor model; Bifurcation; Circuit simulation; Nonlinear equations; Observability; Oscillators; Predictive models; Robustness; Steady-state; Virtual colonoscopy; Voltage;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.856366
