• DocumentCode
    2232618
  • Title

    Nano-scale strain mapping using near-field spectroscopy

  • Author

    Llopis, A. ; Pereira, S.M.S. ; Watson, I.M. ; Krokhin, A.A. ; Neogi, A.

  • Author_Institution
    Dept. of Phys., Univ. of North Texas, Denton, TX, USA
  • fYear
    2011
  • fDate
    1-6 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A technique is presented for mapping the strain in light-emitting nano- and hetero structures using near-field spectroscopy. This technique makes use of theoretical calculations to extract the strain from near-field data.
  • Keywords
    light emitting devices; nanophotonics; spectroscopy; light emitting heterostructures; light emitting nanostructures; nanoscale strain mapping; near-field spectroscopy; Couplings; Gallium nitride; Optical imaging; Phonons; Quantum well devices; Spectroscopy; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2011 Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-4577-1223-4
  • Type

    conf

  • Filename
    5950332
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2232618