• DocumentCode
    2232675
  • Title

    New metrics for architectural level power performance evaluation

  • Author

    Jia, Lihong ; Gao, Yonghong ; Tenhunen, Hannu

  • Author_Institution
    Electron. Syst. Design Lab., R. Inst. of Technol., Stockholm, Sweden
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    549
  • Abstract
    In this paper, we present new metrics to evaluate the performance of VLSI circuits with regards to the power consumption in the architectural level from the system point of view. One advantage of the new metrics is that the metrics not only calculate the power consumption itself but also evaluate the “low power possibility” of the architectures from the system point of view; another advantage is that the metrics consider the effects of the process technology and it can be used to evaluate the power consumption performance in the future advanced VLSI technology. Specially, we point out that reducing power supply voltage to reduce the power consumption will become less and less efficient in the deep submicron regime and thus the architecture-driven voltage scaling low power design approach will not work as well as in the previous technology
  • Keywords
    VLSI; integrated circuit design; low-power electronics; VLSI circuits; architectural level power performance evaluation; architecture-driven voltage scaling; deep submicron regime; power consumption evaluation metrics; process technology effects; Circuits; Costs; Energy consumption; Laboratories; Low voltage; Power supplies; Silicon; System performance; Throughput; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
  • Conference_Location
    Geneva
  • Print_ISBN
    0-7803-5482-6
  • Type

    conf

  • DOI
    10.1109/ISCAS.2000.856387
  • Filename
    856387