• DocumentCode
    2232845
  • Title

    A probability-based approach to VLSI circuit partitioning

  • Author

    Dutt, Shantanu ; Deng, Wenyong

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    1996
  • fDate
    3-7 Jun, 1996
  • Firstpage
    100
  • Lastpage
    105
  • Abstract
    Iterative-improvement 2-way min-cut partitioning is an important phase in most circuit partitioning tools. Most iterative improvement techniques for circuit netlists like the Fidducia-Mattheyses (FM) method compute the gains of nodes using local netlist information that is only concerned with the immediate improvement in the cutset. This can lead to misleading gain calculations. Krishnamurthy suggested a lookahead (LA) gain calculation method to ameliorate this situation; however, as we show, it leaves considerable room for improvement. We present here a probabilistic gain computation approach called PROP that is capable of capturing the global and future implications of moving a node at the current time. Experimental results show that for the same number of runs, PROP performs much better than FM (by about 30%) and LA (by about 27%), and is also better than many recent state-of-the-art clustering-based partitioners like EIG1, WINDOW, MELO and PARABOLI by 15% to 57%. We also show that the space and time complexities of PROP are very reasonable. Our empirical timing results reveal that it is appreciably faster than the above clustering-based techniques, and only a little slower than FM and LA, both of which are very fast
  • Keywords
    VLSI; circuit CAD; integrated circuit design; logic CAD; logic partitioning; probability; Fidducia-Mattheyses method; VLSI circuit partitioning; circuit partitioning tools; empirical timing results; iterative-improvement two-way min-cut partitioning; local netlist information; lookahead gain calculation; probabilistic gain computation approach; probability-based approach; state-of-the-art clustering-based partitioners; Circuit simulation; Circuit testing; Delay; Digital circuits; Integrated circuit interconnections; Iterative methods; Permission; System testing; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference Proceedings 1996, 33rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0738-100X
  • Print_ISBN
    0-7803-3294-6
  • Type

    conf

  • DOI
    10.1109/DAC.1996.545554
  • Filename
    545554