• DocumentCode
    2233289
  • Title

    On-chip analog signal generator for mixed-signal built-in self-test

  • Author

    Dufort, Benoit ; Roberts, Gordon W.

  • Author_Institution
    Lab. of Microelectron. & Comput. Syst., McGill Univ., Montreal, Que., Canada
  • fYear
    1998
  • fDate
    11-14 May 1998
  • Firstpage
    549
  • Lastpage
    552
  • Abstract
    A new method for generating analog signals with very low complexity and hardware requirements has recently been introduced. In this paper, two different silicon implementations are presented and their performance is analyzed through different experimental results. Various ways in which the generators can be used are also demonstrated. Emphasis is placed on the simplicity of the design process and its compact implementation, which are crucial considerations when implementing a Built-In Self-Test (BIST) strategy
  • Keywords
    BiCMOS integrated circuits; built-in self test; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; shift registers; signal generators; built-in self-test; compact implementation; design process; mixed-signal BIST; on-chip analog signal generator; Band pass filters; Built-in self-test; Calibration; Circuit noise; Circuit testing; Delta-sigma modulation; Filtering; Frequency synthesizers; Signal generators; Signal synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1998. Proceedings of the IEEE 1998
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-4292-5
  • Type

    conf

  • DOI
    10.1109/CICC.1998.695038
  • Filename
    695038