DocumentCode
2233458
Title
Modeling of feedthrough and ground loops in SAW filters
Author
Dufilie, Pierre ; Desbois, J.
Author_Institution
Thomson Ultrasound Div., Vernon, CT
fYear
1993
fDate
31 Oct-3 Nov 1993
Firstpage
223
Abstract
Feedthrough and ground loops contribute to time spurious at t=0 in SAW filters. These effects not only limit the rejection level that can be achieved with the filter, but also the amplitude and phase characteristics in the passband. Thus, they must be accurately medalled when designing SAW filters requiring low amplitude and phase ripples and high close-in rejection. Feedthrough is caused mainly by capacitive coupling between the input and output transducers and is dependant on the substrate thickness and method of mounting as well as the physical separation of the transducers. Ground loops are more difficult to predict since they depend on the printed circuit board layout used. It is found that this can be modeled accurately with a common mode inductance to ground. A method will be presented which can be used to predict the feedthrough capacitance between two transducers and a filter design will be presented which can be used which incorporates this effect in the design resulting in improved filter performance. The ground loops equivalent circuit will also be presented along with 521 measurement of a filter and the corresponding computer analysis with the ground loop model
Keywords
low-pass filters; piezoelectric transducers; surface acoustic wave filters; ultrasonic devices; ultrasonic transducers; SAW filters; amplitude characteristics; capacitive coupling; computer analysis; feedthrough; feedthrough capacitance; ground loops; improved filter performance; input transducers; output transducers; passband; phase characteristics; phase ripples; rejection level; Capacitance; Circuit analysis computing; Electrostatics; Equivalent circuits; Inductance; Packaging; Passband; Printed circuits; SAW filters; Transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1993. Proceedings., IEEE 1993
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-2012-3
Type
conf
DOI
10.1109/ULTSYM.1993.339673
Filename
339673
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