DocumentCode :
2233688
Title :
A simple transducer equivalent circuit parameter extraction technique
Author :
Hines, J.H. ; Malocha, Donald C.
Author_Institution :
SSDSL, Central Florida Univ., Orlando, FL
fYear :
1993
fDate :
31 Oct-3 Nov 1993
Firstpage :
173
Abstract :
This paper presents a simple technique for extracting the fundamental SAW transducer equivalent circuit parameters from measurements easily performed on a network analyzer. This technique allows for the separation and unambiguous determination of basic equivalent circuit parameters such as parasitic (thin film) resistance, transducer capacitance, acoustic susceptance, and Hilbert Transform conductance. It is applicable to any transducer geometry, but is particularly useful in model development for unconventional transducer structures, such as narrow gap or multilevel devices. In such cases, quantities such as transducer capacitance and effective coupling may not be easily calculated from previously known relationships. The basic theory for parameter extraction is presented, along with a comparison of experimental data and modeled device performance calculated using the extracted values
Keywords :
S-parameters; acoustic impedance; equivalent circuits; surface acoustic wave devices; transforms; ultrasonic transducers; Hilbert Transform conductance; LiTaO3; SAW transducer; SiO2; acoustic susceptance; effective coupling; equivalent circuit; model; multilevel devices; narrow gap devices; network analyzer; parameter extraction; parasitic thin film resistance; transducer capacitance; Acoustic measurements; Acoustic transducers; Electrical resistance measurement; Equivalent circuits; Parameter extraction; Parasitic capacitance; Performance analysis; Performance evaluation; Surface acoustic waves; Thin film circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1993. Proceedings., IEEE 1993
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2012-3
Type :
conf
DOI :
10.1109/ULTSYM.1993.339683
Filename :
339683
Link To Document :
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