DocumentCode :
2233722
Title :
RF-sputtered BST film microwave tunable device on comparison between MgO(111) and (100) substrate
Author :
Noda, M. ; Yamada, T. ; Torii, T. ; Kamo, T. ; Yamashita, K. ; Funakubo, H. ; Okuyama, M.
fYear :
2009
fDate :
23-27 Aug. 2009
Firstpage :
1
Lastpage :
4
Abstract :
We have increased sufficiently figure-of-merit of (Ba,Sr)TiO3(BST) film microwave tunable device by a few times in frequency range of 20 GHz on MgO(111) from that on MgO(100) substrate. Also found the possibility that it is deeply related to the difference in the film strain.
Keywords :
X-ray diffraction; annealing; barium compounds; dielectric losses; dielectric thin films; magnesium compounds; microwave devices; permittivity; sputter deposition; strontium compounds; (BaSr)TiO3; MgO; RF-sputtered BST film microwave tunable device; XRD; dielectric loss; dielectric permittivity; film strain; frequency 20 GHz; post-annealing; Binary search trees; Capacitors; Dielectric losses; Ferroelectric films; Ferroelectric materials; Materials science and technology; Microwave devices; Microwave technology; Substrates; Tunable circuits and devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location :
Xian
ISSN :
1099-4734
Print_ISBN :
978-1-4244-4970-5
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2009.5307565
Filename :
5307565
Link To Document :
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