DocumentCode
2233722
Title
RF-sputtered BST film microwave tunable device on comparison between MgO(111) and (100) substrate
Author
Noda, M. ; Yamada, T. ; Torii, T. ; Kamo, T. ; Yamashita, K. ; Funakubo, H. ; Okuyama, M.
fYear
2009
fDate
23-27 Aug. 2009
Firstpage
1
Lastpage
4
Abstract
We have increased sufficiently figure-of-merit of (Ba,Sr)TiO3(BST) film microwave tunable device by a few times in frequency range of 20 GHz on MgO(111) from that on MgO(100) substrate. Also found the possibility that it is deeply related to the difference in the film strain.
Keywords
X-ray diffraction; annealing; barium compounds; dielectric losses; dielectric thin films; magnesium compounds; microwave devices; permittivity; sputter deposition; strontium compounds; (BaSr)TiO3; MgO; RF-sputtered BST film microwave tunable device; XRD; dielectric loss; dielectric permittivity; film strain; frequency 20 GHz; post-annealing; Binary search trees; Capacitors; Dielectric losses; Ferroelectric films; Ferroelectric materials; Materials science and technology; Microwave devices; Microwave technology; Substrates; Tunable circuits and devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location
Xian
ISSN
1099-4734
Print_ISBN
978-1-4244-4970-5
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2009.5307565
Filename
5307565
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