• DocumentCode
    2233825
  • Title

    The origin of efficiency droop in GaN-based light-emitting diodes and its solution

  • Author

    Kim, Jong Kyu ; Kim, Min-Ho ; Schubert, Martin F. ; Dai, Qi ; Sakong, Tan ; Yoon, Sukho ; Sone, Cheolsoo ; Park, YongJo ; Piprek, Joachim ; Schubert, E.Fred

  • Author_Institution
    Syst. Eng. Dept., Rensselaer Polytech. Inst., Troy, NY
  • fYear
    2008
  • fDate
    4-9 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The physical origin of efficiency droop in GaN-based light-emitting diodes when driven with high current is systematically investigated. Based on our simulations and experimental results, a polarization-matched active region is proposed as the solution.
  • Keywords
    III-V semiconductors; gallium compounds; light emitting diodes; wide band gap semiconductors; GaN; efficiency droop; light emitting diodes; polarization-matched active region; Electrons; Gallium nitride; Leakage current; Light emitting diodes; Optical polarization; Physics computing; Piezoelectric polarization; Quantum well devices; Systems engineering and theory; Voltage; (230.0250) Optoelectronics; (230.3670) Light-emitting diodes;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-859-9
  • Type

    conf

  • Filename
    4571359