DocumentCode :
2233837
Title :
Intrinsic microwave dielectric loss of lanthanum aluminate
Author :
Shimada, T. ; Ichikawa, K. ; Minemura, T. ; Yamauchi, H. ; Utsumi, W. ; Ishii, Y. ; Breeze, J. ; Alford, Neil McN
Author_Institution :
New Bus. Dev. Center, Hitachi Metals Ltd., Shimamoto, Japan
fYear :
2009
fDate :
23-27 Aug. 2009
Firstpage :
1
Lastpage :
5
Abstract :
The intrinsic dielectric properties of LaAlO3 were investigated in order to understand the microwave properties for several material containing LaAlO3. LaAlO3 single crystal was the prepared by Czochralski method. The temperature dependence of the dielectric properties and neutron inelastic scattering of the single crystal were measured. From these data, the intrinsic dielectric properties were evaluated and it was found that the dielectric loss of the LaAlO3 includes two types of dielectric loss. One is a phonon absorption related loss and the other is the loss arising from Debye type orientation polarization. The latter affects the room temperature dielectric loss in LaAlO3 containing materials. The present study suggested that removing this polarization loss is important to decrease the total dielectric loss.
Keywords :
Debye temperature; crystal growth from melt; dielectric losses; dielectric polarisation; lanthanum compounds; microwave spectra; phonons; Czochralski method; Debye type orientation polarization; LaAlO3; intrinsic microwave dielectric loss; lanthanum aluminate; neutron inelastic scattering; phonon absorption; polarization; room temperature; temperature 293 K to 298 K; Crystalline materials; Dielectric losses; Dielectric materials; Dielectric measurements; Lanthanum; Neutrons; Phonons; Polarization; Scattering; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location :
Xian
ISSN :
1099-4734
Print_ISBN :
978-1-4244-4970-5
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2009.5307570
Filename :
5307570
Link To Document :
بازگشت