• DocumentCode
    2233878
  • Title

    Silicon angular rate sensor for automotive applications with piezoelectric drive and piezoresistive read-out

  • Author

    Voss, Ralf ; Bauer, Karin ; Ficker, Wilhelm ; Gleissner, Tanjo ; Kupke, Winfried ; Rose, Matthias ; Sassen, Stefan ; Schalk, Josef ; Seidel, Helmut ; Stenzel, Erwin

  • Author_Institution
    Dept. of Res. & Technol., Daimler-Benz AG, Munich, Germany
  • Volume
    2
  • fYear
    1997
  • fDate
    16-19 Jun 1997
  • Firstpage
    879
  • Abstract
    In this work a silicon angular rate sensor for automotive applications with a new architecture is presented. It is based on the vibrating tuning fork principle with excitation direction of the tines perpendicular to the wafer surface. This arrangement allows the design of tines with significant inertial masses which lead to substantial signal. The oscillation of the tines is excited by a piezoelectric drive using an AlN thin film layer. The angular rate to be measured causes a torsional oscillation of the stem. The torsional amplitude is proportional to the angular rate and is measured by a piezoresistive read-out structure. We use silicon bulk micromachining based on a new twofold SOI-technique
  • Keywords
    angular velocity measurement; automotive electronics; elemental semiconductors; micromachining; microsensors; piezoelectric actuators; piezoresistive devices; semiconductor technology; silicon; silicon-on-insulator; vibrations; AlN thin film layer; SOI; Si; Si angular rate sensor; Si micromachining; Si-AlN; automotive applications; excitation direction; piezoelectric drive; piezoresistive read-out; torsional amplitude; torsional oscillation; vibrating tuning fork; Automotive applications; Automotive engineering; Frequency; Gyroscopes; Laser tuning; Mechanical sensors; Piezoresistance; Silicon; Solid modeling; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-3829-4
  • Type

    conf

  • DOI
    10.1109/SENSOR.1997.635242
  • Filename
    635242