• DocumentCode
    2233904
  • Title

    The effects of scaling on the performance of small-signal MOS amplifiers: a physics-based simulation study

  • Author

    Fiegna, Claudio

  • Author_Institution
    Ferrara Univ., Italy
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    733
  • Abstract
    Physics-based device simulation is applied to study the effects of scaling on the performance of small signal MOS amplifiers. The limitations set by non-ideal scaling of the electrical characteristics of the MOSFET and their implications on the trade-off between power dissipation and performance are analyzed and discussed
  • Keywords
    CMOS analogue integrated circuits; operational amplifiers; MOSFET electrical characteristic; OTA; amplifier performance; nonideal scaling; op amps; physics-based device simulation; power dissipation; scaling effects; small-signal MOS amplifiers; CMOS technology; Circuit simulation; Degradation; Doping; Electric variables; Frequency estimation; MOSFET circuits; Power MOSFET; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
  • Conference_Location
    Geneva
  • Print_ISBN
    0-7803-5482-6
  • Type

    conf

  • DOI
    10.1109/ISCAS.2000.856433
  • Filename
    856433