The extraction of transistor mismatch parameters: the CMOS current-steering D/A converter as a test structure

Since transistor mismatch directly affects the performances of a broad class of analog CMOS devices such as comparators, A/D and D/A converters, it is of the utmost importance to determine these parameters for every available CMOS technology. Nowadays, this is done by processing and evaluating a large number of especially designed test structures that have no further use. This paper presents a technique to extract the transistor mismatch parameters from the performance of a simple current-steering CMOS D/A converter