DocumentCode :
2234007
Title :
Reusable embedded debugger for 32 bit RISC processor using the JTAG boundary scan architecture
Author :
Jung, Dae-Young ; Kwak, Sung-Ho ; Lee, Moon-Key
Author_Institution :
Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea
fYear :
2002
fDate :
2002
Firstpage :
209
Lastpage :
212
Abstract :
The traditional debug tools for chip tests and software developments need huge investment and plenty of time. These problems can be overcome by an embedded debugger based the JTAG boundary scan architecture. Thus, the IEEE 1149.1 standard is adopted by ASIC designers for testability problems. We designed the RED (reusable embedded debugger) using the JTAG boundary scan architecture. The proposed debugger is applicable for not only chip test but also software debugging. Our debugger has an additional hardware module (EICEM: embedded ICE module) for more critical real-time debugging.
Keywords :
IEEE standards; boundary scan testing; embedded systems; fault location; integrated circuit testing; microprocessor chips; program debugging; reduced instruction set computing; 32 bit; ASIC design; IEEE 1149.1 standard; JTAG boundary scan architecture; RISC processor; chip test; chip tests; debug tools; embedded ICE module; hardware module; investment; real-time debugging; reusable embedded debugger; software debugging; software developments; Circuits; Computer architecture; Costs; Hardware; Ice; Investments; Protocols; Reduced instruction set computing; Software debugging; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2002. Proceedings. 2002 IEEE Asia-Pacific Conference on
Print_ISBN :
0-7803-7363-4
Type :
conf
DOI :
10.1109/APASIC.2002.1031569
Filename :
1031569
Link To Document :
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